The Characterization of Errors in an FPGA-Based RISC-V Processor due to Single Event Transients

Jhalak Sharma, Nanditha Rao. The Characterization of Errors in an FPGA-Based RISC-V Processor due to Single Event Transients. Microelectronics Journal, 123:105392, 2022. [doi]

Authors

Jhalak Sharma

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Nanditha Rao

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