Jhalak Sharma, Nanditha Rao. The Characterization of Errors in an FPGA-Based RISC-V Processor due to Single Event Transients. Microelectronics Journal, 123:105392, 2022. [doi]
@article{SharmaR22,
title = {The Characterization of Errors in an FPGA-Based RISC-V Processor due to Single Event Transients},
author = {Jhalak Sharma and Nanditha Rao},
year = {2022},
doi = {10.1016/j.mejo.2022.105392},
url = {https://doi.org/10.1016/j.mejo.2022.105392},
researchr = {https://researchr.org/publication/SharmaR22},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {123},
pages = {105392},
}