R. K. Sharma, Aditi Sood. Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2010, 5-7 July 2010, Lixouri Kefalonia, Greece. pages 381-386, IEEE Computer Society, 2010. [doi]
@inproceedings{SharmaS10-2,
title = {Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair},
author = {R. K. Sharma and Aditi Sood},
year = {2010},
doi = {10.1109/ISVLSI.2010.88},
url = {http://dx.doi.org/10.1109/ISVLSI.2010.88},
tags = {modeling, testing},
researchr = {https://researchr.org/publication/SharmaS10-2},
cites = {0},
citedby = {0},
pages = {381-386},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2010, 5-7 July 2010, Lixouri Kefalonia, Greece},
publisher = {IEEE Computer Society},
}