Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair - researchr publication

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R. K. Sharma, Aditi Sood. Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2010, 5-7 July 2010, Lixouri Kefalonia, Greece. pages 381-386, IEEE Computer Society, 2010. [doi]

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