Syed Zafar Shazli, Mohammed A. Abdul-Aziz, Mehdi Baradaran Tahoori, David R. Kaeli. A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.