Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Morteza Sheikh, Jamshid Aghaei, Armin Letafat, Mohammad Rajabdorri, Taher Niknam, Miadreza Shafie-khah, João P. S. Catalão. Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating. IEEE Systems Journal, 13(4):3933-3943, 2019. [doi]

This author has not been identified. Look up 'Morteza Sheikh' in GoogleThis author has not been identified. Look up 'Jamshid Aghaei' in GoogleThis author has not been identified. Look up 'Armin Letafat' in GoogleThis author has not been identified. Look up 'Mohammad Rajabdorri' in GoogleThis author has not been identified. Look up 'Taher Niknam' in GoogleThis author has not been identified. Look up 'Miadreza Shafie-khah' in GoogleThis author has not been identified. Look up 'João P. S. Catalão' in Google

runs on WebDSL