Morteza Sheikh, Jamshid Aghaei, Armin Letafat, Mohammad Rajabdorri, Taher Niknam, Miadreza Shafie-khah, João P. S. Catalão. Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating. IEEE Systems Journal, 13(4):3933-3943, 2019. [doi]
@article{SheikhALRNSC19,
title = {Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating},
author = {Morteza Sheikh and Jamshid Aghaei and Armin Letafat and Mohammad Rajabdorri and Taher Niknam and Miadreza Shafie-khah and João P. S. Catalão},
year = {2019},
doi = {10.1109/JSYST.2019.2939210},
url = {https://doi.org/10.1109/JSYST.2019.2939210},
researchr = {https://researchr.org/publication/SheikhALRNSC19},
cites = {0},
citedby = {0},
journal = {IEEE Systems Journal},
volume = {13},
number = {4},
pages = {3933-3943},
}