Morteza Sheikh, Jamshid Aghaei, Armin Letafat, Mohammad Rajabdorri, Taher Niknam, Miadreza Shafie-khah, João P. S. Catalão. Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating. IEEE Systems Journal, 13(4):3933-3943, 2019. [doi]
Abstract is missing.