Kaship Sheikh, Shu-Jen Han, Lan Wei. CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization. IEEE Trans. on Circuits and Systems, 63-I(12):2209-2221, 2016. [doi]
@article{SheikhHW16-0,
title = {CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization},
author = {Kaship Sheikh and Shu-Jen Han and Lan Wei},
year = {2016},
doi = {10.1109/TCSI.2016.2617828},
url = {http://dx.doi.org/10.1109/TCSI.2016.2617828},
researchr = {https://researchr.org/publication/SheikhHW16-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {63-I},
number = {12},
pages = {2209-2221},
}