Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Kaship Sheikh, Shu-Jen Han, Lan Wei. CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization. IEEE Trans. on Circuits and Systems, 63-I(12):2209-2221, 2016. [doi]