Kaship Sheikh, Lan Wei. Methodology to Capture Statistical Effect of Process Imperfections on Glitch Suppression in CNFET Circuits and to Improve by Using Approximate Circuits. In Deming Chen, Houman Homayoun, Baris Taskin, editors, Proceedings of the 2018 on Great Lakes Symposium on VLSI, GLSVLSI 2018, Chicago, IL, USA, May 23-25, 2018. pages 27-32, ACM, 2018. [doi]
Abstract is missing.