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X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm

Junjie Shen, Pengfei Chen, Lei Su, Tielin Shi, Zirong Tang, Guanglan Liao. X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm. Microelectronics Reliability, 67:129-134, 2016. [doi]

Authors

Junjie Shen

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Pengfei Chen

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Lei Su

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Tielin Shi

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Zirong Tang

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Guanglan Liao

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