X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm

Junjie Shen, Pengfei Chen, Lei Su, Tielin Shi, Zirong Tang, Guanglan Liao. X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm. Microelectronics Reliability, 67:129-134, 2016. [doi]

Abstract

Abstract is missing.