Junjie Shen, Pengfei Chen, Lei Su, Tielin Shi, Zirong Tang, Guanglan Liao. X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm. Microelectronics Reliability, 67:129-134, 2016. [doi]
@article{ShenCSSTL16,
title = {X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm},
author = {Junjie Shen and Pengfei Chen and Lei Su and Tielin Shi and Zirong Tang and Guanglan Liao},
year = {2016},
doi = {10.1016/j.microrel.2016.10.011},
url = {http://dx.doi.org/10.1016/j.microrel.2016.10.011},
researchr = {https://researchr.org/publication/ShenCSSTL16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {67},
pages = {129-134},
}