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Towards Automated Identification of Layering Violations in Embedded Applications (WIP)

Mingjie Shen, James C. Davis 0001, Aravind Machiry. Towards Automated Identification of Layering Violations in Embedded Applications (WIP). In Bernhard Egger, Dongyoon Lee, editors, Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2023, Orlando, FL, USA, 18 June 2023. pages 143-147, ACM, 2023. [doi]

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Mingjie Shen

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James C. Davis 0001

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Aravind Machiry

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