Mingjie Shen, James C. Davis 0001, Aravind Machiry. Towards Automated Identification of Layering Violations in Embedded Applications (WIP). In Bernhard Egger, Dongyoon Lee, editors, Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2023, Orlando, FL, USA, 18 June 2023. pages 143-147, ACM, 2023. [doi]
Abstract is missing.