Mingjie Shen, James C. Davis 0001, Aravind Machiry. Towards Automated Identification of Layering Violations in Embedded Applications (WIP). In Bernhard Egger, Dongyoon Lee, editors, Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2023, Orlando, FL, USA, 18 June 2023. pages 143-147, ACM, 2023. [doi]
@inproceedings{ShenDM23,
title = {Towards Automated Identification of Layering Violations in Embedded Applications (WIP)},
author = {Mingjie Shen and James C. Davis 0001 and Aravind Machiry},
year = {2023},
doi = {10.1145/3589610.3596271},
url = {https://doi.org/10.1145/3589610.3596271},
researchr = {https://researchr.org/publication/ShenDM23},
cites = {0},
citedby = {0},
pages = {143-147},
booktitle = {Proceedings of the 24th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2023, Orlando, FL, USA, 18 June 2023},
editor = {Bernhard Egger and Dongyoon Lee},
publisher = {ACM},
}