On average power dissipation and random pattern testability of CMOS combinational logic networks

Amelia Shen, Abhijit Ghosh, Srinivas Devadas, Kurt Keutzer. On average power dissipation and random pattern testability of CMOS combinational logic networks. In ICCAD. pages 402-407, 1992. [doi]

Authors

Amelia Shen

This author has not been identified. Look up 'Amelia Shen' in Google

Abhijit Ghosh

This author has not been identified. Look up 'Abhijit Ghosh' in Google

Srinivas Devadas

This author has not been identified. Look up 'Srinivas Devadas' in Google

Kurt Keutzer

This author has not been identified. Look up 'Kurt Keutzer' in Google