Amelia Shen, Abhijit Ghosh, Srinivas Devadas, Kurt Keutzer. On average power dissipation and random pattern testability of CMOS combinational logic networks. In ICCAD. pages 402-407, 1992. [doi]
@inproceedings{ShenGDK92, title = {On average power dissipation and random pattern testability of CMOS combinational logic networks}, author = {Amelia Shen and Abhijit Ghosh and Srinivas Devadas and Kurt Keutzer}, year = {1992}, doi = {10.1145/304032.304142}, url = {http://doi.acm.org/10.1145/304032.304142}, tags = {testing, random testing, logic}, researchr = {https://researchr.org/publication/ShenGDK92}, cites = {0}, citedby = {0}, pages = {402-407}, booktitle = {ICCAD}, }