Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters - researchr publication authors

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Yue Shen, Xiaoyan Guo, Quan Sun, Yong Huang. Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters. In EEET 2020: 3rd International Conference on Electronics and Electrical Engineering Technology, Kitakyushu, Japan, September, 2020. pages 23-27, ACM, 2020. [doi]

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