Yue Shen, Xiaoyan Guo, Quan Sun, Yong Huang. Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters. In EEET 2020: 3rd International Conference on Electronics and Electrical Engineering Technology, Kitakyushu, Japan, September, 2020. pages 23-27, ACM, 2020. [doi]
Abstract is missing.