Yue Shen, Xiaoyan Guo, Quan Sun, Yong Huang. Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters. In EEET 2020: 3rd International Conference on Electronics and Electrical Engineering Technology, Kitakyushu, Japan, September, 2020. pages 23-27, ACM, 2020. [doi]
@inproceedings{ShenGSH20, title = {Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters}, author = {Yue Shen and Xiaoyan Guo and Quan Sun and Yong Huang}, year = {2020}, doi = {10.1145/3429536.3429547}, url = {https://doi.org/10.1145/3429536.3429547}, researchr = {https://researchr.org/publication/ShenGSH20}, cites = {0}, citedby = {0}, pages = {23-27}, booktitle = {EEET 2020: 3rd International Conference on Electronics and Electrical Engineering Technology, Kitakyushu, Japan, September, 2020}, publisher = {ACM}, isbn = {978-1-4503-8756-9}, }