Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng. Very-Low-Voltage testing of amorphous silicon TFT circuits. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
@inproceedings{ShenLLC09,
title = {Very-Low-Voltage testing of amorphous silicon TFT circuits},
author = {Shiue-Tsung Shen and Wei-Hsiao Liu and Chien-Mo James Li and I-Chun Cheng},
year = {2009},
doi = {10.1109/TEST.2009.5355808},
url = {http://dx.doi.org/10.1109/TEST.2009.5355808},
researchr = {https://researchr.org/publication/ShenLLC09},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}