Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng. Very-Low-Voltage testing of amorphous silicon TFT circuits. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
Abstract is missing.