Shiue-Tsung Shen, Wei-Hsiao Liu, En-Hua Ma, James Chien-Mo Li, I-Chun Cheng. Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 75-80, IEEE Computer Society, 2009. [doi]
Abstract is missing.