TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS - researchr publication

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Zhengguo Shen, Junyi Qian, Keran Li, Ziyu Li, Lishuo Deng, Weiwei Shan. TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2023, Haikou, China, November 5-8, 2023. pages 1-3, IEEE, 2023. [doi]

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