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Coverage Directed Test Generation: Godson Experience

Haihua Shen, Wenli Wei, Yunji Chen, Bowen Chen, Qi Guo. Coverage Directed Test Generation: Godson Experience. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 321-326, IEEE Computer Society, 2008. [doi]

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