Kele Shen, Dong Xiang, Zhou Jiang. Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 7-12, IEEE Computer Society, 2014. [doi]
@inproceedings{ShenXJ14-1,
title = {Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing},
author = {Kele Shen and Dong Xiang and Zhou Jiang},
year = {2014},
doi = {10.1109/ATS.2014.14},
url = {http://dx.doi.org/10.1109/ATS.2014.14},
researchr = {https://researchr.org/publication/ShenXJ14-1},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6030-9},
}