Yue Shen, Changhao Yan, Sheng-Guo Wang, Dian Zhou, Xuan Zeng 0001. An Efficient Yield Estimation Method for Layouts of High Dimensional and High Sigma SRAM Arrays. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1723-1728, IEEE, 2021. [doi]
Abstract is missing.