Variability and yield improvement: rules, models, and characterization - researchr publication authors

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Kenneth L. Shepard, Daniel N. Maynard. Variability and yield improvement: rules, models, and characterization. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 834-835, ACM, 2006. [doi]

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