Variability and yield improvement: rules, models, and characterization

Kenneth L. Shepard, Daniel N. Maynard. Variability and yield improvement: rules, models, and characterization. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 834-835, ACM, 2006. [doi]

@inproceedings{ShepardM06,
  title = {Variability and yield improvement: rules, models, and characterization},
  author = {Kenneth L. Shepard and Daniel N. Maynard},
  year = {2006},
  doi = {10.1145/1233501.1233677},
  url = {http://doi.acm.org/10.1145/1233501.1233677},
  tags = {rule-based, rules},
  researchr = {https://researchr.org/publication/ShepardM06},
  cites = {0},
  citedby = {0},
  pages = {834-835},
  booktitle = {2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA},
  editor = {Soha Hassoun},
  publisher = {ACM},
  isbn = {1-59593-389-1},
}