Ravinder S. Shergill, Pak-Ho Yeung, Patrick A. Tucci. Built-in test methodology for a full custom processor chip. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 571-575, IEEE, 1989. [doi]
Abstract is missing.