Mark Sherriff, Nachiappan Nagappan, Laurie A. Williams, Mladen A. Vouk. Early estimation of defect density using an in-process Haskell metrics model. In Proceedings of the ICSE 2005 Workshop on Advances in Model-Based Software Testing, A-MOST 2005, St. Louis, Missouri, USA. ACM, 2005. [doi]
Abstract is missing.