James Shey, Justin A. Blanco, T. Owens Walker, Thomas W. Tedesso, Hau T. Ngo, Ryan N. Rakvic, Kevin D. Fairbanks. Monitoring Device Current to Characterize Trim Operations of Solid-State Drives. IEEE Transactions on Information Forensics and Security, 14(5):1296-1306, 2019. [doi]
@article{SheyBWTNRF19,
title = {Monitoring Device Current to Characterize Trim Operations of Solid-State Drives},
author = {James Shey and Justin A. Blanco and T. Owens Walker and Thomas W. Tedesso and Hau T. Ngo and Ryan N. Rakvic and Kevin D. Fairbanks},
year = {2019},
doi = {10.1109/TIFS.2018.2876835},
url = {https://doi.org/10.1109/TIFS.2018.2876835},
researchr = {https://researchr.org/publication/SheyBWTNRF19},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Information Forensics and Security},
volume = {14},
number = {5},
pages = {1296-1306},
}