Monitoring Device Current to Characterize Trim Operations of Solid-State Drives

James Shey, Justin A. Blanco, T. Owens Walker, Thomas W. Tedesso, Hau T. Ngo, Ryan N. Rakvic, Kevin D. Fairbanks. Monitoring Device Current to Characterize Trim Operations of Solid-State Drives. IEEE Transactions on Information Forensics and Security, 14(5):1296-1306, 2019. [doi]

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