James Shey, Justin A. Blanco, T. Owens Walker, Thomas W. Tedesso, Hau T. Ngo, Ryan N. Rakvic, Kevin D. Fairbanks. Monitoring Device Current to Characterize Trim Operations of Solid-State Drives. IEEE Transactions on Information Forensics and Security, 14(5):1296-1306, 2019. [doi]
Abstract is missing.