A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers

Junyou Shi, Yi Deng, Zili Wang, Qingjie He. A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers. IEEE T. Instrumentation and Measurement, 69(3):782-793, 2020. [doi]

Authors

Junyou Shi

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Yi Deng

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Zili Wang

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Qingjie He

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