A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers

Junyou Shi, Yi Deng, Zili Wang, Qingjie He. A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers. IEEE T. Instrumentation and Measurement, 69(3):782-793, 2020. [doi]

Abstract

Abstract is missing.