Junyou Shi, Yi Deng, Zili Wang, Qingjie He. A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers. IEEE T. Instrumentation and Measurement, 69(3):782-793, 2020. [doi]
@article{ShiDWH20,
title = {A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers},
author = {Junyou Shi and Yi Deng and Zili Wang and Qingjie He},
year = {2020},
doi = {10.1109/TIM.2019.2905307},
url = {https://doi.org/10.1109/TIM.2019.2905307},
researchr = {https://researchr.org/publication/ShiDWH20},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {69},
number = {3},
pages = {782-793},
}