Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak. Partial state monitoring for fault detection estimation. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
Abstract is missing.