A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits

Congyin Shi, Sanghoon Lee, Sergio Soto Aguilar, Edgar Sánchez-Sinencio. A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits. J. Electronic Testing, 34(3):313-320, 2018. [doi]

Abstract

Abstract is missing.