SPIN-PAC: test compaction for speed-independent circuits

Feng Shi, Yiorgos Makris. SPIN-PAC: test compaction for speed-independent circuits. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 71-74, ACM Press, 2005. [doi]

Abstract

Abstract is missing.