Feng Shi, Yiorgos Makris. Testing delay faults in asynchronous handshake circuits. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 193-197, ACM, 2006. [doi]
@inproceedings{ShiM06:2, title = {Testing delay faults in asynchronous handshake circuits}, author = {Feng Shi and Yiorgos Makris}, year = {2006}, doi = {10.1145/1233501.1233540}, url = {http://doi.acm.org/10.1145/1233501.1233540}, tags = {testing}, researchr = {https://researchr.org/publication/ShiM06%3A2}, cites = {0}, citedby = {0}, pages = {193-197}, booktitle = {2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA}, editor = {Soha Hassoun}, publisher = {ACM}, isbn = {1-59593-389-1}, }