Fast and robust skew detection for scanned documents - researchr publication authors

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Na Shi, Jinxiao Pan. Fast and robust skew detection for scanned documents. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 4170-4173, IEEE, 2011. [doi]

This author has not been identified. Look up 'Na Shi' in GoogleThis author has not been identified. Look up 'Jinxiao Pan' in Google

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