Na Shi, Jinxiao Pan. Fast and robust skew detection for scanned documents. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 4170-4173, IEEE, 2011. [doi]
@inproceedings{ShiP11, title = {Fast and robust skew detection for scanned documents}, author = {Na Shi and Jinxiao Pan}, year = {2011}, doi = {10.1109/EMEIT.2011.6023104}, url = {http://dx.doi.org/10.1109/EMEIT.2011.6023104}, researchr = {https://researchr.org/publication/ShiP11}, cites = {0}, citedby = {0}, pages = {4170-4173}, booktitle = {International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011}, publisher = {IEEE}, isbn = {978-1-61284-087-1}, }