Built-In Self-Test for Embedded Voltage Regulator

Jiang Shi, Ricky Smith. Built-In Self-Test for Embedded Voltage Regulator. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 133-136, IEEE Computer Society, 2008. [doi]

Authors

Jiang Shi

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Ricky Smith

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