Jiang Shi, Ricky Smith. Built-In Self-Test for Embedded Voltage Regulator. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 133-136, IEEE Computer Society, 2008. [doi]
@inproceedings{ShiS08:6,
title = {Built-In Self-Test for Embedded Voltage Regulator},
author = {Jiang Shi and Ricky Smith},
year = {2008},
doi = {10.1109/DELTA.2008.41},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.41},
tags = {testing},
researchr = {https://researchr.org/publication/ShiS08%3A6},
cites = {0},
citedby = {0},
pages = {133-136},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}