C.-J. Richard Shi, Michael W. Tian. Automatic Test Generation for Linear Analog Circuits under Parameter Variations. In ASP-DAC. pages 501-506, 1998.
@inproceedings{ShiT98,
title = {Automatic Test Generation for Linear Analog Circuits under Parameter Variations},
author = {C.-J. Richard Shi and Michael W. Tian},
year = {1998},
tags = {testing, C++},
researchr = {https://researchr.org/publication/ShiT98},
cites = {0},
citedby = {0},
pages = {501-506},
booktitle = {ASP-DAC},
}