Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
C.-J. Richard Shi, Michael W. Tian. Automatic Test Generation for Linear Analog Circuits under Parameter Variations. In ASP-DAC. pages 501-506, 1998.
No references recorded for this publication.
No citations of this publication recorded.