Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki. GECOM: Test data compression combined with all unknown response masking. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 577-582, IEEE, 2008. [doi]
Abstract is missing.